基本信息
出版地:UNITED STATES
期刊简称:IEEE DES TEST
通讯地址:445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141
创刊年份:2013
发行周期:6 issues/year
涉及方向:COMPUTER SCIENCE, HARDWARE & ARCHITECTURE - ENGINEERING, ELECTRICAL & ELECTRONIC
ESSN:2168-2364
英文期刊简介
IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.
中文期刊简介
《Ieee Design & Test》是一本由IEEE Computer Society出版商出版的专业工程技术期刊，该刊创刊于2013年，刊期6 issues/year，该刊已被国际权威数据库SCIE收录。在中科院最新升级版分区表中，该刊分区信息为大类学科：工程技术 3区，小类学科：计算机：硬件 4区；工程：电子与电气 4区；在JCR（Journal Citation Reports）分区等级为Q3。该刊发文范围涵盖计算机：硬件等领域，旨在及时、准确、全面地报道国内外计算机：硬件工作者在该领域取得的最新研究成果、工作进展及学术动态、技术革新等，促进学术交流，鼓励学术创新。2021年影响因子为2.223，
