基本信息
出版地:UNITED STATES
期刊简称:IEEE T RELIAB
通讯地址:IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141
创刊年份:1963
发行周期:Quarterly
涉及方向:工程技术 - 工程:电子与电气
ESSN:1558-1721
英文期刊简介
IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to ways of predicting and measuring behavior in the field. As an engineering subject that supports new and existing technologies, we constantly expand into new areas of the assurance sciences.
中文期刊简介
《Ieee Transactions On Reliability》是一本由IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC出版商出版的专业工程技术期刊,该刊创刊于1963年,刊期Quarterly,该刊已被国际权威数据库SCIE收录。在中科院最新升级版分区表中,该刊分区信息为大类学科:计算机科学 2区,小类学科:计算机:硬件 2区;计算机:软件工程 2区;工程:电子与电气 2区;在JCR(Journal Citation Reports)分区等级为Q1。该刊发文范围涵盖计算机:硬件等领域,旨在及时、准确、全面地报道国内外计算机:硬件工作者在该领域取得的最新研究成果、工作进展及学术动态、技术革新等,促进学术交流,鼓励学术创新。2021年影响因子为5.883,平均审稿速度约4.5个月。